40 keV–60 keV · Uniform Irradiation · Batch-Process Ready
The vacuum electron source irradiation system is used for radiation-tolerance testing and characterization of chips, circuit boards, electronic systems, batteries, and other materials, devices, and equipment. With continuously adjustable dose rates, it enables qualitative and quantitative verification of harsh space radiation environments in a vacuum.
High Performance
Self-Stabilizing
History Data Logging
Upgradable & Extensible
Self-Stabilizing
History Data Logging
Upgradable & Extensible
Key Applications
Material & Device IrradiationRadiation-tolerance testing for chips, circuit boards, electronic systems, and batteries
Space Environment SimulationContinuously adjustable dose rates for space radiation environment verification
Qualitative/Quantitative CharacterizationQualitative and quantitative verification of harsh space environments
Batch Processing100 mm–1000 mm wide exposure field, uniformity ≥90%
Main Unit & Core Functions
- Equipped with an essential beam diagnostics and monitoring subsystem, including current measurement, spot size measurement, and beam parameter diagnostics
- EPICS-based control system with local/remote control, safety interlock interfaces, and parameter and measurement history logging
- Upgradable and extensible in terms of output beam current
- Electron beam energy of 40 keV–60 keV, beam current of 1 µA–100 µA
- Exposure field diameter adjustable from 100 mm to 1000 mm, uniformity ≥90%
Irradiation Source HV Power Supply
- HV power supply connected to the main unit via spatial HV cable bundles
- Highly integrated design combining 4 power modules: HV supply, filament current source, anode supply, and focusing supply
- Comprehensive protection incl. overvoltage, overcurrent, overheat, and discharge detection for long-term continuous operation
Key Specifications
| Parameter | Specification |
|---|---|
| Beam Energy | 40 keV–60 keV adjustable, step size ≤2 keV |
| Beam Current | DC beam, adjustable within 1 µA–100 µA |
| Exposure Field | Ø 100 mm–1000 mm adjustable |
| Irradiation Uniformity | ≥90% |
| Vacuum Level | better than 2×10⁻⁴ Pa |
| Spot Size Resolution | better than 0.1 mm |
| Current Measurement Resolution | better than 10 nA |
| Control System | EPICS-based, local/remote control, history logging |
| Safety Functions | complete protection incl. overvoltage, overcurrent, overheat, and discharge detection |