Spacecraft in orbit are continuously bombarded by high-energy electrons, protons, and heavy ions. Radiation effects can degrade semiconductor device performance or even cause failure. Ground-based irradiation testing is therefore an unavoidable step in verifying the reliability of space electronics — and electron beam irradiation systems are the key equipment for this purpose.
Characteristics of the Space Radiation Environment
High-energy electron fluxes in the Earth’s radiation belts vary dynamically with orbital altitude and solar activity. For semiconductor devices, total ionizing dose (TID) effects cause threshold shifts and increased leakage current, while displacement damage reduces carrier lifetime, affecting bipolar and optoelectronic devices.
Advantages of Electron Beam Irradiation Testing
- Continuously adjustable dose rate: simulates dose rate levels of different orbital environments and supports accelerated testing;
- In-situ online measurement: device electrical parameters are monitored during irradiation versus fluence and time, avoiding annealing interference;
- Vacuum compatibility: irradiation and measurement inside a vacuum chamber closely match real on-orbit conditions.
Our Solution
Our irradiation performance characterization systems perform irradiation testing of chips, circuit boards, and complete equipment in a controlled vacuum, integrating in-situ electrical parameter measurement, radiation damage monitoring, and thermal management evaluation modules, with continuously adjustable dose rates — meeting stringent verification needs from component level to system level.
Visit our Products & Services page for detailed specifications.