Irradiation performance characterization systems are key test platforms for accurately evaluating the overall performance of chips, circuit boards, and equipment under irradiation environments. By precisely simulating space radiation environments, the system enables in-situ, online characterization of core components. Core functions include: precisely measuring the evolution of key electrical parameters of devices and equipment versus fluence rate and time in a controlled vacuum environment; simultaneously monitoring radiation damage effects in materials such as lattice defect generation and electrical property degradation; and optionally integrating a thermal management evaluation module to analyze irradiation heating and thermoelectric coupling effects.
For radiation-tolerance testing of chips, circuit boards, electronic systems, and batteries, we offer two mature, integrated irradiation system solutions.
Product Series
Irradiation Performance Testing & Characterization System
10 keV–200 keV wide energy range, large sample chamber, integrated beam diagnostics and HV power supply, local/remote control.
Vacuum Electron Source Irradiation System
40 keV–60 keV medium energy range, 100 mm–1000 mm wide exposure field, uniformity ≥90%, ideal for batch uniform irradiation processes.